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Metrologic Accused Of Patent Infringement


Blackwood, New Jersey – Metrologic Instruments, Inc. (NASDAQ-NMS:MTLG), today announced that on May 10, 2006, PSC Scanning, Inc., a subsidiary of PSC Inc., filed a Complaint against Metrologic Instruments, Inc. in the United States District Court in Oregon. The essence of the claim is that Metrologic’s Stratos product line of bi-optic scanners infringes two PSC patents. The suit seeks equitable relief and damages. Metrologic strongly disputes these claims and intends to vigorously defend this action and its intellectual property.

As reported in our first quarter earnings press release on May 9, 2006, Metrologic continues to show dramatic revenue growth and is gaining market share as verified by independent research organizations, outpacing the industry at large. Our consistent ability to grow sales extends to many product lines across the globe, allowing us to make inroads into markets previously dominated by only one or two manufacturers.

Metrologic’s Stratos product fa

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Did You Know?

You may apply for a patent for your invention.

Inventors may apply for one of two types of patent applications: (1) A non-provisional application, which begins the examination process and may lead to a patent and (2) A provisional application, which establishes a filing date but does not begin the examination process.

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 Helpful Patent Terms

IC

Definition:
International Class - class(es) assigned to a mark under the International Classification of Goods and Services (Nice Agreement); used in the United States since 1 September 1973

Mere Descriptiveness

Definition:
Statutory basis (Trademark Act Section 2(e)(1), 15 U.S.C. Section 1052(e)(1), TMEP 1209 et seq) for refusing registration of trademarks and service marks because the proposed mark merely describes an ingredient, quality, characteristic, function, feature,

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